SEMICONDUCTOR INTERFACES STUDIED BY SCANNING TUNNELING MICROSCOPY AND POTENTIOMETRY

被引：10

作者：

MURALT, P ^{[1
]}

机构：

[1] IBM CORP,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND

来源：

SURFACE SCIENCE | 1987年 / 181卷 / 1-2期

关键词：

D O I：

10.1016/0039-6028(87)90173-7

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：324 / 332

页数：9

共 50 条

[1] SEMICONDUCTOR INTERFACES STUDIED BY SCANNING TUNNELING MICROSCOPY AND POTENTIOMETRY
MURALT, P
[J]. SCANNING MICROSCOPY, 1987, : 67 - 73
[2] SCANNING TUNNELING MICROSCOPY AND POTENTIOMETRY ON A SEMICONDUCTOR HETEROJUNCTION
MURALT, P
MEIER, H
POHL, DW
SALEMINK, HWM
[J]. APPLIED PHYSICS LETTERS, 1987, 50 (19) : 1352 - 1354
[3] SCANNING TUNNELING MICROSCOPY OF SEMICONDUCTOR SURFACES AND INTERFACES
HUMBERT, A
[J]. JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1989, 14 (02): : 113 - 130
[4] Scanning tunneling potentiometry of semiconductor junctions
Dong, Y
Feenstra, RM
Hey, R
Ploog, KH
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2002, 20 (04): : 1677 - 1681
[5] APPLICATION OF SCANNING-TUNNELING-MICROSCOPY TO SEMICONDUCTOR ELECTROLYTE INTERFACES
UOSAKI, K
KOINUMA, M
[J]. FARADAY DISCUSSIONS, 1992, 94 : 361 - 368
[6] SCANNING TUNNELING MICROSCOPY (STM) OF SEMICONDUCTOR SURFACES AND METAL-SEMICONDUCTOR INTERFACES
SALVAN, F
HUMBERT, A
DUMAS, P
THIBAUDAU, F
[J]. ANNALES DE PHYSIQUE, 1988, 13 (03) : 133 - 152
[7] ELECTROMIGRATION KINETICS OF GOLD ON A CARBON THIN-FILM SURFACE STUDIED BY SCANNING-TUNNELING-MICROSCOPY AND SCANNING TUNNELING POTENTIOMETRY
BESOLD, J
KUNZE, R
MATZ, N
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, 12 (03): : 1764 - 1767
[8] GAAS PN JUNCTION STUDIED BY SCANNING TUNNELING POTENTIOMETRY
MURALT, P
[J]. APPLIED PHYSICS LETTERS, 1986, 49 (21) : 1441 - 1443
[9] Formation of GaAs/AlAs(001) interfaces studied by scanning tunneling microscopy
Behrend, J
Wassermeier, M
Braun, W
Krispin, P
Ploog, KH
[J]. PHYSICAL REVIEW B, 1996, 53 (15): : 9907 - 9912
[10] FORMATION OF METAL GAAS(110) INTERFACES STUDIED BY SCANNING TUNNELING MICROSCOPY
FEENSTRA, RM
[J]. APPLIED SURFACE SCIENCE, 1992, 56-8 : 104 - 116

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