SCANNING TUNNELING MICROSCOPY OF SEMICONDUCTOR SURFACES AND INTERFACES

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作者：

HUMBERT, A

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来源：

JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES | 1989年 / 14卷 / 02期

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TM [电工技术]; TN [电子技术、通信技术];

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0808 ; 0809 ;

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页码：113 / 130

页数：18

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