SCANNING TUNNELING MICROSCOPY (STM) OF SEMICONDUCTOR SURFACES AND METAL-SEMICONDUCTOR INTERFACES

被引：6

作者：

SALVAN, F

HUMBERT, A

DUMAS, P

THIBAUDAU, F

机构：

来源：

关键词：

D O I：

10.1051/anphys:01988001303013300

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：133 / 152

页数：20

共 50 条

[1] STM STUDIES ON SEMICONDUCTOR SURFACES AND METAL-SEMICONDUCTOR INTERFACES
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[J]. MICROSCOPY MICROANALYSIS MICROSTRUCTURES, 1990, 1 (5-6): : 463 - 470
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[J]. JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1989, 14 (02): : 113 - 130
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[J]. JOURNAL OF ELECTRON MICROSCOPY, 1990, 39 (03): : 196 - 196
[4] Scanning tunneling microscopy of semiconductor surfaces
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[5] SCANNING TUNNELING MICROSCOPY OF SEMICONDUCTOR SURFACES
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[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1983, 1 (03): : 703 - 704
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[J]. SURFACE SCIENCE, 1986, 168 (1-3) : 734 - 743
[7] SCANNING TUNNELING MICROSCOPY OF CLEAVED SEMICONDUCTOR SURFACES
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[J]. IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1986, 30 (05) : 466 - 471
[8] METAL-SEMICONDUCTOR TUNNELING
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[J]. BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1969, 14 (01): : 43 - &
[9] METAL-SEMICONDUCTOR INTERFACES
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[J]. SURFACE SCIENCE, 1969, 13 (01) : 13 - &
[10] METAL-SEMICONDUCTOR INTERFACES
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