SCANNING TUNNELING MICROSCOPY (STM) OF SEMICONDUCTOR SURFACES AND METAL-SEMICONDUCTOR INTERFACES

被引:6
|
作者
SALVAN, F
HUMBERT, A
DUMAS, P
THIBAUDAU, F
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D O I
10.1051/anphys:01988001303013300
中图分类号
O4 [物理学];
学科分类号
0702 ;
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页码:133 / 152
页数:20
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