INTERPRETATION OF DEEP-LEVEL OPTICAL SPECTROSCOPY AND DEEP-LEVEL TRANSIENT SPECTROSCOPY DATA - APPLICATION TO IRRADIATION DEFECTS IN GAAS

被引：52
|
作者：
LOUALICHE, S
NOUAILHAT, A
GUILLOT, G
LANNOO, M
机构：
[1] INST NATL SCI APPL LYON,PHYS MATIERE LAB,F-69621 VILLEURBANNE,FRANCE
[2] INST SUPER ELECTR NORD,CNRS,PHYS SOLIDES LAB 253,F-59046 LILLE,FRANCE
来源：
PHYSICAL REVIEW B | 1984年 / 30卷 / 10期
关键词：
D O I：
10.1103/PhysRevB.30.5822
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：5822 / 5834
页数：13
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