DEEP-LEVEL TRANSIENT SPECTROSCOPY - CHARACTERIZATION AND IDENTIFICATION OF ELECTRONIC DEFECTS

被引：3
|
作者：
JOHNSON, NM
机构：
来源：
OPTICAL ENGINEERING | 1986年 / 25卷 / 05期
关键词：
D O I：
10.1117/12.7973888
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：698 / 704
页数：7
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