FREQUENCY-INDUCED ELECTRON DELOCALIZATION AND FRACTIONAL QUANTIZATION IN SILICON INVERSION-LAYERS

被引：15

作者：

LONG, AP

MYRON, HW

PEPPER, M

机构：

[1] CATHOLIC UNIV NIJMEGEN,DEPT PHYS,NIJMEGEN,NETHERLANDS

[2] GEC HIRST RES CTR,WEMBLEY,MIDDX,ENGLAND

来源：

JOURNAL OF PHYSICS C-SOLID STATE PHYSICS | 1984年 / 17卷 / 17期

关键词：

D O I：

10.1088/0022-3719/17/17/004

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：L433 / L438

页数：6

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