FREQUENCY-INDUCED ELECTRON DELOCALIZATION AND FRACTIONAL QUANTIZATION IN SILICON INVERSION-LAYERS

被引：15
|
作者：
LONG, AP
MYRON, HW
PEPPER, M
机构：
[1] CATHOLIC UNIV NIJMEGEN,DEPT PHYS,NIJMEGEN,NETHERLANDS
[2] GEC HIRST RES CTR,WEMBLEY,MIDDX,ENGLAND
来源：
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS | 1984年 / 17卷 / 17期
关键词：
D O I：
10.1088/0022-3719/17/17/004
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
引用
收藏
页码：L433 / L438
页数：6
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