TEMPERATURE-DEPENDENCE OF GAAS IMPACT IONIZATION COEFFICIENTS

被引：0
|
作者：
ROBBINS, VM
LARSEN, CM
STILLMAN, GE
机构：
[1] UNIV ILLINOIS,COORDINATED SCI LAB,CTR COMPOUND SEMICOND MICROELECTR,URBANA,IL 61801
[2] UNIV ILLINOIS,MAT RES LAB,URBANA,IL 61801
来源：
JOURNAL OF ELECTRONIC MATERIALS | 1987年 / 16卷 / 04期
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D O I：
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：A11 / A11
页数：1
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