INFRARED STUDIES OF BE-DOPED GAAS GROWN BY MOLECULAR-BEAM EPITAXY AT LOW-TEMPERATURES

被引:6
|
作者
TALWAR, DN
MANASREH, MO
STUTZ, CE
KASPI, R
EVANS, KR
机构
[1] Wright Laboratory, Solid State Electronics Directorate, (WL/ELRA), 45433, OH, Wright-Patterson AFB
关键词
LT-GAAS; FOURIER TRANSFORM INFRARED SPECTROMETER (FTIR); LOCALIZED VIBRATIONAL MODES (LVM); GREENS FUNCTION;
D O I
10.1007/BF02649996
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Samples of molecular beam epitaxial GaAs grown at low temperatures doped with Be defects are studied as a function of growth temperature (T-G) by measuring their localized vibrational modes at 77K using BOMEM Fourier transform infrared spectrometer. Localized vibrational modes of Be-9(Ga) in samples grown at T-G>350 degrees C have been identified at 482 cm(-1). Secondary ion mass spectroscopy measurements show that the densities of Be defects remain approximately constant as T-G is lowered, however, additional structure in the Be-9(Ga) localized vibrational mode is observed. Calculations based on Green's function theory suggest that the additional structure in Be-doped LT GaAs can best be explained in terms of a complex center [Be-9(Ga)-As-Ga] involving an intrinsic defect.
引用
收藏
页码:1445 / 1448
页数:4
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