SINGLE EVENT UPSET VULNERABILITY OF SELECTED 4K AND 16K CMOS STATIC RAMS

被引：11
|
作者：
KOLASINSKI, WA
KOGA, R
BLAKE, JB
BRUCKER, G
PANDYA, P
PETERSEN, E
PRICE, W
机构：
[1] HUGHES AIRCRAFT CO,NEWPORT BEACH,CA 92663
[2] RCA CORP,PRINCETON,NJ 08540
[3] USN,RES LAB,WASHINGTON,DC 20375
[4] CALTECH,JET PROP LAB,PASADENA,CA 91103
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1982年 / 29卷 / 06期
关键词：
D O I：
10.1109/TNS.1982.4336493
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：2044 / 2048
页数：5
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