SINGLE EVENT UPSET VULNERABILITY OF SELECTED 4K AND 16K CMOS STATIC RAMS

被引：11

作者：

KOLASINSKI, WA

KOGA, R

BLAKE, JB

BRUCKER, G

PANDYA, P

PETERSEN, E

PRICE, W

机构：

[1] HUGHES AIRCRAFT CO,NEWPORT BEACH,CA 92663

[2] RCA CORP,PRINCETON,NJ 08540

[3] USN,RES LAB,WASHINGTON,DC 20375

[4] CALTECH,JET PROP LAB,PASADENA,CA 91103

来源：

关键词：

D O I：

10.1109/TNS.1982.4336493

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：2044 / 2048

页数：5

共 50 条

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