SIGNAL ELECTRONICS FOR HIGH-RESOLUTION IRRADIATION SCANNING MICROSCOPY

被引：0
|
作者：
KRISCH, B [1 ]
MULLER, KH [1 ]
RINDFLEISCH, V [1 ]
SCHLIEPE, R [1 ]
机构：
[1] SIEMENS AG,MESSGERATEWERK BERLIN,BEREICH ELEKTR MIKROSKOPIE,BERLIN,FED REP GER
来源：
MIKROSKOPIE | 1976年 / 32卷 / 5-6期
关键词：
D O I：
暂无
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
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页码：189 / 189
页数：1
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