High-resolution line-scanning optical coherence microscopy

被引:43
|
作者
Chen, Yu [1 ]
Huang, Shu-Wei
Aguirre, Aaron D.
Fujimoto, James G.
机构
[1] MIT, Dept Elect Engn & Comp Sci, Cambridge, MA 02139 USA
[2] MIT, Elect Res Lab, Cambridge, MA 02139 USA
关键词
D O I
10.1364/OL.32.001971
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
An optical coherence microscopy system based on line illumination and detection is demonstrated. The system uses a Linnik-type interferometer illuminated by a broadband Ti:sapphire laser and detected by a highspeed, line-scan CCD camera. This approach is less sensitive to incoherent scattering and sample motion than full-field imaging. Spatial resolutions of similar to 2 mu m x similar to 3 Am (transverse x axial) are achieved. The sensitivity of the system is 93 dB with averaging over 30 line scans. En face real time, cellular-level imaging of biological tissues is demonstrated at similar to 2 frames/s. (c) 2007 Optical Society of America.
引用
收藏
页码:1971 / 1973
页数:3
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