A REAL-TIME ELECTRON-BEAM TESTING SYSTEM

被引：0

作者：

FUJIOKA, H ^{[1
]}

NAKAMAE, K ^{[1
]}

HIROTA, M ^{[1
]}

URA, K ^{[1
]}

TAKASHIMA, S ^{[1
]}

机构：

[1] JEOL LTD, TOKYO 196, JAPAN

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1989年 / 22卷 / 03期

关键词：

D O I：

10.1088/0022-3735/22/3/001

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：138 / 143

页数：6

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