HIGH-SPEED ELECTRON-BEAM TESTING

被引：2

|

作者：

CHIU, G

HALBOUT, JM

MAY, P

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1988年 / 6卷 / 06期

关键词：

D O I：

10.1116/1.584159

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：1814 / 1819

页数：6

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