NONDESTRUCTIVE ANALYSIS OF THIN ZNXCD1-XS FILMS BY RUTHERFORD BACKSCATTERING AND OPTICAL MEASUREMENTS

被引：1
|
作者：
REINSPERGER, GU [1 ]
SCHWABE, F [1 ]
SELLE, B [1 ]
机构：
[1] FRIEDRICH SCHILLER UNIV,SEKT PHYS,BEREICH IONOMETRIE,DDR-6900 JENA,GER DEM REP
来源：
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1985年 / 88卷 / 02期
关键词：
D O I：
10.1002/pssa.2210880242
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：745 / 751
页数：7
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