NANOMETER SCALE ETCHING OF MX2-MATERIALS USING SCANNING TUNNELING MICROSCOPY

被引：0
|
作者：
HUANG, JL [1 ]
KIM, Y [1 ]
LIEBER, CM [1 ]
机构：
[1] COLUMBIA UNIV,DEPT CHEM,NEW YORK,NY 10027
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 1991年 / 202卷
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D O I：
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中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
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页码：364 / PHYS
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