INHERENT ANALYSIS ERROR IN X-RAY SPECTROMETRY

被引：8
|
作者：
PLESCH, R [1 ]
机构：
[1] SIEMENS AG,BEREICH MESS & PROZESS TECH,D-7500 KARLSRUHE,FED REP GER
来源：
FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE | 1976年 / 282卷 / 05期
关键词：
D O I：
10.1007/BF00424402
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
引用
收藏
页码：417 / 425
页数：9
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