INHERENT ANALYSIS ERROR IN X-RAY SPECTROMETRY

被引：8
|
作者：
PLESCH, R [1 ]
机构：
[1] SIEMENS AG,BEREICH MESS & PROZESS TECH,D-7500 KARLSRUHE,FED REP GER
来源：
FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE | 1976年 / 282卷 / 05期
关键词：
D O I：
10.1007/BF00424402
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
引用
收藏
页码：417 / 425
页数：9
相关论文
共 50 条
  • [21] X-RAY SPECTROMETRY
    MACDONALD, GL
    ANALYTICAL CHEMISTRY, 1978, 50 (05) : R135 - R142
  • [22] X-RAY SPECTROMETRY
    MACDONALD, GL
    ANALYTICAL CHEMISTRY, 1982, 54 (05) : R150 - R156
  • [23] X-ray Spectrometry
    Tsuji, Kouichi
    Nakano, Kazuhiko
    Takahashi, Yoshio
    Hayashi, Kouichi
    Ro, Chul-Un
    ANALYTICAL CHEMISTRY, 2010, 82 (12) : 4950 - 4987
  • [24] X-RAY SPECTROMETRY
    TOROK, SB
    VANGRIEKEN, RE
    ANALYTICAL CHEMISTRY, 1992, 64 (12) : R180 - R196
  • [25] X-ray spectrometry
    Szalóki, I
    Török, SB
    Injuk, J
    Van Grieken, RE
    ANALYTICAL CHEMISTRY, 2002, 74 (12) : 2895 - 2917
  • [26] X-ray spectrometry
    Szaloki, Imre
    Osan, Janos
    Van Grieken, Rene E.
    ANALYTICAL CHEMISTRY, 2006, 78 (12) : 4069 - 4096
  • [27] X-ray spectrometry
    Török, SB
    Lábár, J
    Schmeling, M
    Van Grieken, RE
    ANALYTICAL CHEMISTRY, 1998, 70 (12) : 495R - 517R
  • [28] X-RAY SPECTROMETRY
    MARKOWICZ, AA
    VANGRIEKEN, RE
    ANALYTICAL CHEMISTRY, 1988, 60 (12) : R28 - R42
  • [29] X-RAY SPECTROMETRY
    MARKOWICZ, AA
    VANGRIEKEN, RE
    ANALYTICAL CHEMISTRY, 1986, 58 (05) : R279 - R294
  • [30] X-RAY SPECTROMETRY
    MARKOWICZ, AA
    VANGRIEKEN, RE
    ANALYTICAL CHEMISTRY, 1990, 62 (12) : R101 - R113
12345