INHERENT ANALYSIS ERROR IN X-RAY SPECTROMETRY

被引：8
|
作者：
PLESCH, R [1 ]
机构：
[1] SIEMENS AG,BEREICH MESS & PROZESS TECH,D-7500 KARLSRUHE,FED REP GER
来源：
FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE | 1976年 / 282卷 / 05期
关键词：
D O I：
10.1007/BF00424402
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
引用
收藏
页码：417 / 425
页数：9
相关论文
共 50 条
  • [31] X-ray spectrometry
    Szalóki, I
    Török, SB
    Ro, CU
    Injuk, J
    Van Grieken, RE
    ANALYTICAL CHEMISTRY, 2000, 72 (12) : 211R - 233R
  • [32] X-ray spectrometry
    Szalóki, I
    Osán, J
    Van Grieken, RE
    ANALYTICAL CHEMISTRY, 2004, 76 (12) : 3445 - 3470
  • [33] X-ray spectrometry and X-ray microtomography techniques for soil and geological samples analysis
    Kubala-Kukus, A.
    Banas, D.
    Braziewicz, J.
    Dziadowicz, M.
    Kopec, E.
    Majewska, U.
    Mazurek, M.
    Pajek, M.
    Sobisz, M.
    Stabrawa, I.
    Wudarczyk-Mocko, J.
    Gozdz, S.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2015, 364 : 85 - 92
  • [34] ERROR REDUCTION IN X-RAY SPECTROMETRY BY MEANS OF A REFERENCE-CHANNEL
    BLOKHIN, MA
    OVCHAREN.EY
    MYAGKOV, PI
    SOTNIKOV, VA
    MAMONOV, YM
    BELKINA, GL
    INDUSTRIAL LABORATORY, 1965, 31 (04): : 517 - &
  • [35] ESTIMATE OF INSTRUMENTAL ERROR OF X-RAY SPECTRAL ANALYSIS
    NIKOLSKI.AP
    TRONEVA, NV
    EVLANOV, IY
    NAZAROV, VK
    ZAVELEV, LV
    INDUSTRIAL LABORATORY, 1969, 35 (08): : 1125 - &
  • [36] The transistor and energy-dispersive x-ray spectrometry: roots and milestones in x-ray analysis
    Ryon, RW
    X-RAY SPECTROMETRY, 2001, 30 (06) : 361 - 372
  • [37] X-RAY MICROSCOPE OPERATION AND INHERENT PROPERTIES
    NEWBERRY, SP
    JOURNAL OF APPLIED PHYSICS, 1954, 25 (11) : 1454 - 1454
  • [38] ESTIMATION OF THE ERROR OF X-RAY SPECTRAL-ANALYSIS
    KALININ, BD
    PLOTNIKOV, RI
    INDUSTRIAL LABORATORY, 1992, 58 (09): : 822 - 824
  • [39] ERROR COMPONENT ANALYSIS IN THE METROLOGY OF X-RAY MASKS
    FOSS, GO
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1990, 8 (06): : 2028 - 2031
  • [40] PLANT MINERAL ANALYSIS BY X-RAY FLUORESCENCE SPECTROMETRY
    JENKINS, R
    HURLEY, PW
    SHORROCK.VM
    ANALYST, 1966, 91 (1083) : 395 - &
12345