INHERENT ANALYSIS ERROR IN X-RAY SPECTROMETRY

被引：8

作者：

PLESCH, R ^{[1
]}

机构：

[1] SIEMENS AG,BEREICH MESS & PROZESS TECH,D-7500 KARLSRUHE,FED REP GER

来源：

FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE | 1976年 / 282卷 / 05期

关键词：

D O I：

10.1007/BF00424402

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：417 / 425

页数：9

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