SECONDARY ION MASS-SPECTROMETRY - A LOCAL PROBE FOR ORGANIC LAYERS CHARACTERIZATION

被引：2
|
作者：
BOLBACH, G [1 ]
BLAIS, JC [1 ]
HEBERT, N [1 ]
机构：
[1] UNIV PIERRE & MARIE CURIE,F-75231 PARIS 05,FRANCE
来源：
MOLECULAR CRYSTALS AND LIQUID CRYSTALS | 1988年 / 156卷
关键词：
D O I：
10.1080/00268948808070586
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
引用
收藏
页码：361 / 370
页数：10
相关论文
共 50 条
  • [41] ENHANCED IONIZATION OF ORGANIC SALTS IN SECONDARY-ION MASS-SPECTROMETRY
    HSU, BH
    XIE, YX
    BUSCH, KL
    COOKS, RG
    INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1983, 51 (2-3): : 225 - 233
  • [42] SOME ASPECTS OF SECONDARY ION MASS-SPECTROMETRY OF ORGANIC-COMPOUNDS
    BENNINGHOVEN, A
    INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1983, 53 (SEP): : 85 - 99
  • [43] COMPOSITIONAL ANALYSIS OF HGCDTE EPITAXIAL LAYERS USING SECONDARY ION MASS-SPECTROMETRY
    BUBULAC, LO
    EDWALL, DD
    CHEUNG, JT
    VISWANATHAN, CR
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1992, 10 (04): : 1633 - 1637
  • [44] STRUCTURAL CHARACTERIZATION OF REACTIVE DYES USING LIQUID SECONDARY-ION MASS-SPECTROMETRY TANDEM MASS-SPECTROMETRY
    RICHARDSON, SD
    THRUSTON, AD
    MCGUIRE, JM
    WEBER, EJ
    ORGANIC MASS SPECTROMETRY, 1993, 28 (05): : 619 - 625
  • [45] STRUCTURAL CHARACTERIZATION OF SULFONATED AZO DYES USING LIQUID SECONDARY ION MASS-SPECTROMETRY TANDEM MASS-SPECTROMETRY
    RICHARDSON, SD
    MCGUIRE, JM
    THRUSTON, AD
    BAUGHMAN, GL
    ORGANIC MASS SPECTROMETRY, 1992, 27 (03): : 289 - 299
  • [46] MOLECULAR SECONDARY ION MASS-SPECTROMETRY - NEW DIMENSIONS IN CHEMICAL CHARACTERIZATION
    COLTON, RJ
    CAMPANA, JE
    KIDWELL, DA
    ROSS, MM
    WYATT, JR
    APPLIED SURFACE SCIENCE, 1985, 21 (1-4) : 168 - 198
  • [47] CHARACTERIZATION OF POLYMERS USING STATIC SECONDARY ION MASS-SPECTROMETRY (SIMS)
    MICHAEL, RS
    VANOOIJ, WJ
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1988, 196 : 154 - PMSE
  • [48] MOLECULAR ION IMAGING AND DYNAMIC SECONDARY ION MASS-SPECTROMETRY OF ORGANIC-COMPOUNDS
    GILLEN, G
    SIMONS, DS
    WILLIAMS, P
    ANALYTICAL CHEMISTRY, 1990, 62 (19) : 2122 - 2130
  • [49] ORGANIC ION IMAGING BEYOND THE LIMIT OF STATIC SECONDARY-ION MASS-SPECTROMETRY
    MCMAHON, JM
    DOOKERAN, NN
    TODD, PJ
    JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY, 1995, 6 (11) : 1047 - 1058
  • [50] A NOVEL ION IMAGER FOR SECONDARY ION MASS-SPECTROMETRY
    MATSUMOTO, K
    YURIMOTO, H
    KOSAKA, K
    MIYATA, K
    NAKAMURA, T
    SUENO, S
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1993, 40 (01) : 82 - 85
12345