共 50 条
- [1] MATERIALS CHARACTERIZATION USING SECONDARY ION MASS-SPECTROMETRY (SIMS) [J]. SCANNING ELECTRON MICROSCOPY, 1984, : 1557 - 1566
- [2] SECONDARY ION MASS-SPECTROMETRY (SIMS) [J]. JOURNAL OF ELECTRON MICROSCOPY, 1975, 24 (01): : 57 - 58
- [4] SECONDARY ION MASS-SPECTROMETRY (SIMS) [J]. PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS, 1984, 8 (1-2): : 11 - 57
- [5] MOLECULAR SECONDARY ION MASS-SPECTROMETRY (SIMS) [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 18 (03): : 737 - 747
- [8] SURFACE OXIDATION STUDIES OF IRON USING STATIC METHOD OF SECONDARY ION MASS-SPECTROMETRY (SIMS) [J]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1974, 21 (02): : 479 - 486
- [9] SECONDARY ION MASS-SPECTROMETRY OF POLYMERS [J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1983, 46 (JAN): : 483 - 486
- [10] CHARACTERIZATION OF RUBBER SURFACES BY STATIC SECONDARY ION MASS-SPECTROMETRY [J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1990, 199 : 52 - MACRO