SECONDARY ION MASS-SPECTROMETRY (SIMS)

被引：0

作者：

ODAWARA, O

机构：

来源：

DENKI KAGAKU | 1990年 / 58卷 / 03期

关键词：

D O I：

暂无

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

引用

页码：211 / 217

页数：7

共 50 条

[1] SECONDARY ION MASS-SPECTROMETRY (SIMS)
SHINODA, G
[J]. JOURNAL OF ELECTRON MICROSCOPY, 1975, 24 (01): : 57 - 58
[2] SECONDARY ION MASS-SPECTROMETRY (SIMS)
STUCK, R
SIFFERT, P
[J]. PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS, 1984, 8 (1-2): : 11 - 57
[3] MOLECULAR SECONDARY ION MASS-SPECTROMETRY (SIMS)
COLTON, RJ
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 18 (03): : 737 - 747
[4] SECONDARY ION MASS-SPECTROMETRY (SIMS) OF SILICON
GRASSERBAUER, M
STINGEDER, G
[J]. VACUUM, 1989, 39 (11-12) : 1077 - 1087
[5] METALLURGICAL APPLICATIONS OF SECONDARY ION MASS-SPECTROMETRY (SIMS)
DEGREVE, F
THORNE, NA
LANG, JM
[J]. JOURNAL OF MATERIALS SCIENCE, 1988, 23 (12) : 4181 - 4208
[6] THE DEVELOPMENT OF SECONDARY ION MASS-SPECTROMETRY (SIMS) - A RETROSPECTIVE
HONIG, RE
[J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1985, 66 (01): : 31 - 54
[7] ANALYSIS OF HYDROGEN IN METALS BY SECONDARY ION MASS-SPECTROMETRY (SIMS)
ZUCHNER, H
HUSER, B
[J]. ZEITSCHRIFT FUR PHYSIKALISCHE CHEMIE NEUE FOLGE, 1986, 147 : 35 - 45
[8] SECONDARY ION MASS-SPECTROMETRY (SIMS) OF ELECTROACTIVE MONOLAYERS ON GOLD
FRISBIE, CD
MARTIN, JR
DUFF, RR
WRIGHTON, MS
[J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1991, 201 : 332 - INOR
[9] MATERIALS CHARACTERIZATION USING SECONDARY ION MASS-SPECTROMETRY (SIMS)
KATZ, W
SMITH, GA
[J]. SCANNING ELECTRON MICROSCOPY, 1984, : 1557 - 1566
[10] THE HYDRATION OF CEMENT STUDIED BY SECONDARY ION MASS-SPECTROMETRY (SIMS)
GERHARD, W
NAGELE, E
[J]. CEMENT AND CONCRETE RESEARCH, 1983, 13 (06) : 849 - 860

← 1 2 3 4 5 →