SECONDARY ION MASS-SPECTROMETRY - A LOCAL PROBE FOR ORGANIC LAYERS CHARACTERIZATION

被引:2
|
作者
BOLBACH, G [1 ]
BLAIS, JC [1 ]
HEBERT, N [1 ]
机构
[1] UNIV PIERRE & MARIE CURIE,F-75231 PARIS 05,FRANCE
来源
关键词
D O I
10.1080/00268948808070586
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
引用
收藏
页码:361 / 370
页数:10
相关论文
共 50 条
  • [31] SECONDARY ION MASS-SPECTROMETRY OF OLIGOPEPTIDES
    BEAVIS, R
    ENS, W
    STANDING, KG
    WESTMORE, JB
    INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1983, 46 (JAN): : 471 - 474
  • [32] QUADRUPOLES FOR SECONDARY ION MASS-SPECTROMETRY
    DAWSON, PH
    INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1975, 17 (04): : 447 - 467
  • [33] SECONDARY ION MASS-SPECTROMETRY OF SEMICONDUCTORS
    WILSON, RG
    PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1984, 463 : 86 - 87
  • [34] SECONDARY ION MASS-SPECTROMETRY (SIMS)
    STUCK, R
    SIFFERT, P
    PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS, 1984, 8 (1-2): : 11 - 57
  • [35] SECONDARY-ION MASS-SPECTROMETRY
    GRASSERBAUER, M
    CHEMIE IN UNSERER ZEIT, 1994, 28 (05) : 222 - 232
  • [36] SECONDARY ION MASS-SPECTROMETRY OF POLYMERS
    CAMPANA, JE
    ROSE, SL
    INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1983, 46 (JAN): : 483 - 486
  • [37] SECONDARY-ION MASS-SPECTROMETRY
    ZALM, PC
    VACUUM, 1994, 45 (6-7) : 753 - 772
  • [38] MOLECULAR SECONDARY ION MASS-SPECTROMETRY
    PACHUTA, SJ
    COOKS, RG
    ACS SYMPOSIUM SERIES, 1985, 291 : 1 - 42
  • [39] CHARACTERIZATION OF METAL-COMPLEX-CONTAINING ORGANIC POLYMERIC FILMS BY SECONDARY ION MASS-SPECTROMETRY
    SURRIDGE, NA
    LINTON, RW
    HUPP, JT
    BRYAN, SR
    MEYER, TJ
    GRIFFIS, DP
    ANALYTICAL CHEMISTRY, 1986, 58 (12) : 2443 - 2447
  • [40] SECONDARY ION MASS-SPECTROMETRY - CATIONIZATION OF ORGANIC-MOLECULES WITH METALS
    GRADE, H
    COOKS, RG
    JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1978, 100 (18) : 5615 - 5621