TEST POINT SELECTION METHODS FOR THE SELF-TESTING BASED ANALOG FAULT-DIAGNOSIS SYSTEM

被引：3
|
作者：
WU, CC
机构：
来源：
IEE PROCEEDINGS-G CIRCUITS DEVICES AND SYSTEMS | 1985年 / 132卷 / 05期
关键词：
D O I：
10.1049/ip-g-1.1985.0037
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：173 / 183
页数：11
相关论文
共 50 条
  • [1] ANALOG CIRCUIT FAULT-DIAGNOSIS - BASED ON SENSITIVITY COMPUTATION AND FUNCTIONAL TESTING
    SLAMANI, M
    KAMINSKA, B
    [J]. IEEE DESIGN & TEST OF COMPUTERS, 1992, 9 (01): : 30 - 39
  • [2] BUILT-IN SELF-TEST (BIST) STRUCTURE FOR ANALOG CIRCUIT FAULT-DIAGNOSIS
    WEY, CL
    [J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1990, 39 (03) : 517 - 521
  • [3] Test Point Selection Method for Analog Circuit Fault Diagnosis Based on Similarity Coefficient
    Ma, Qingfeng
    He, Yuzhu
    Zhou, Fuqiang
    Song, Ping
    [J]. MATHEMATICAL PROBLEMS IN ENGINEERING, 2018, 2018
  • [4] Entropy Based Test Point Evaluation and Selection Method for Analog Circuit Fault Diagnosis
    Gao, Yuan
    Yang, Chenglin
    Tian, Shulin
    Chen, Fang
    [J]. MATHEMATICAL PROBLEMS IN ENGINEERING, 2014, 2014
  • [5] TIME DOMAIN TESTING STRATEGIES AND FAULT-DIAGNOSIS FOR ANALOG SYSTEMS
    DAI, H
    SOUDERS, TM
    [J]. IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE //: IMTC / PERVASIVE I & M TECHNOLOGY, 1989, : 293 - 298
  • [6] Test point selection for analog fault diagnosis of unpowered circuit boards
    Huang, JL
    Cheng, KT
    [J]. IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, 2000, 47 (10) : 977 - 987
  • [7] A SIMPLE FAULT-DIAGNOSIS SYSTEM WITH PERIODIC TESTING
    YASUI, K
    NAKAGAWA, T
    [J]. IEEE TRANSACTIONS ON RELIABILITY, 1989, 38 (05) : 571 - 572
  • [8] ON MINIMAL SET OF TEST NODES FOR FAULT DICTIONARY OF ANALOG CIRCUIT FAULT-DIAGNOSIS
    PRASAD, VC
    BABU, NSC
    [J]. JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 1995, 7 (03): : 255 - 258
  • [9] COMPUTER-GENERATION OF TOPOLOGICAL EQUATIONS AND PSEUDOCIRCUITS FOR THE SELF TESTING ANALOG FAULT-DIAGNOSIS ALGORITHM
    WU, CC
    WU, YY
    [J]. IEE PROCEEDINGS-G CIRCUITS DEVICES AND SYSTEMS, 1986, 133 (06): : 273 - 278
  • [10] Methods of Handling the Tolerance and Test-Point Selection Problem for Analog-Circuit Fault Diagnosis
    Yang, Chenglin
    Tian, Shulin
    Long, Bing
    Chen, Fang
    [J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2011, 60 (01) : 176 - 185
12345