COMPUTER-GENERATION OF TOPOLOGICAL EQUATIONS AND PSEUDOCIRCUITS FOR THE SELF TESTING ANALOG FAULT-DIAGNOSIS ALGORITHM

被引：3

作者：

WU, CC

WU, YY

机构：

[1] NATL TAIWAN INST TECHNOL,DEPT ELECT ENGN,TAIPEI 10772,TAIWAN

[2] NATL CHENG KUNG UNIV,DEPT ELECT ENGN,TAINAN,TAIWAN

来源：

IEE PROCEEDINGS-G CIRCUITS DEVICES AND SYSTEMS | 1986年 / 133卷 / 06期

关键词：

D O I：

10.1049/ip-g-1.1986.0046

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：273 / 278

页数：6

共 12 条

[1] A TOPOLOGICAL APPROACH TO FAULT-DIAGNOSIS IN ANALOG CIRCUITS
GAO, XC
LEACH, DP
CHAN, SP
[J]. INTERNATIONAL JOURNAL OF ELECTRONICS, 1986, 60 (05) : 545 - 560
[2] ON THE TOPOLOGICAL TESTABILITY CONJECTURE FOR ANALOG FAULT-DIAGNOSIS PROBLEMS
TOGAWA, Y
MATSUMOTO, T
[J]. IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS, 1984, 31 (02): : 147 - 158
[3] TIME DOMAIN TESTING STRATEGIES AND FAULT-DIAGNOSIS FOR ANALOG SYSTEMS
DAI, H
SOUDERS, TM
[J]. IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE //: IMTC / PERVASIVE I & M TECHNOLOGY, 1989, : 293 - 298
[4] TEST POINT SELECTION METHODS FOR THE SELF-TESTING BASED ANALOG FAULT-DIAGNOSIS SYSTEM
WU, CC
[J]. IEE PROCEEDINGS-G CIRCUITS DEVICES AND SYSTEMS, 1985, 132 (05): : 173 - 183
[5] ANALOG CIRCUIT FAULT-DIAGNOSIS - BASED ON SENSITIVITY COMPUTATION AND FUNCTIONAL TESTING
SLAMANI, M
KAMINSKA, B
[J]. IEEE DESIGN & TEST OF COMPUTERS, 1992, 9 (01): : 30 - 39
[6] TIME-DOMAIN TESTING STRATEGIES AND FAULT-DIAGNOSIS FOR ANALOG SYSTEMS
DAI, H
SOUDERS, TM
[J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1990, 39 (01) : 157 - 162
[7] BUILT-IN SELF-TEST (BIST) STRUCTURE FOR ANALOG CIRCUIT FAULT-DIAGNOSIS
WEY, CL
[J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1990, 39 (03) : 517 - 521
[8] COMPUTER SIMULATION OF TESTING PROCEDURES FOR FAULT DIAGNOSIS IN ANALOG CIRCUITS.
Hatzopoulos, A.A.
Kontoleon, J.M.
[J]. Modelling, Measurement and Control A, 1986, 8 (02): : 37 - 48
[9] ALTERNATIVE BUILT-IN SELF-TEST (BIST) STRUCTURES FOR ANALOG CIRCUIT FAULT-DIAGNOSIS
WEY, CL
[J]. ELECTRONICS LETTERS, 1991, 27 (18) : 1627 - 1628
[10] BUILT-IN SELF-TEST (BIST) STRUCTURES FOR ANALOG CIRCUIT FAULT-DIAGNOSIS WITH CURRENT TEST DATA
WEY, CL
KRISHNAN, S
[J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1992, 41 (04) : 535 - 539

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