ON MINIMAL SET OF TEST NODES FOR FAULT DICTIONARY OF ANALOG CIRCUIT FAULT-DIAGNOSIS

被引：7

作者：

PRASAD, VC

BABU, NSC

机构：

[1] Electrical Engineering Dept., Indian Institute of Technology, New Delhi, 110016, Hauz Khas

来源：

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS | 1995年 / 7卷 / 03期

关键词：

ANALOG CIRCUITS; FAULT DICTIONARY; TEST NODES;

D O I：

10.1007/BF00995317

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A method is proposed to obtain a minimal set of test nodes of an analog circuit for isolating all faulty conditions in the fault dictionary approach. Relevant theorem along with the proof is also given. Proposed method is extremely fast. This method is illustrated with an active filter circuit example.

引用

页码：255 / 258

页数：4

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