TEST POINT SELECTION METHODS FOR THE SELF-TESTING BASED ANALOG FAULT-DIAGNOSIS SYSTEM

被引：3
|
作者：
WU, CC
机构：
来源：
IEE PROCEEDINGS-G CIRCUITS DEVICES AND SYSTEMS | 1985年 / 132卷 / 05期
关键词：
D O I：
10.1049/ip-g-1.1985.0037
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：173 / 183
页数：11
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