A method for the automatic selection of test frequencies in analog fault diagnosis

被引：49
|
作者：
Grasso, Francesco [1 ]
Luchetta, Antonio [1 ]
Manetti, Stefano [1 ]
Piccirilli, Maria Cristina [1 ]
机构：
[1] Univ Florence, Dept Elect & Telecommun, I-50139 Florence, Italy
来源：
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 2007年 / 56卷 / 06期
关键词：
analog circuits; fault diagnosis; fault location; genetic algorithms (GA); symbolic techniques; testability analysis;
D O I：
10.1109/TIM.2007.907947
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
-A new procedure for the selection of test frequencies in the parametric fault diagnosis of analog circuits is presented. It is based on the evaluation of algebraic indices, as the condition number and the norm of the inverse, of a sensitivity matrix of the circuit under test. This matrix is obtained starting from the testability analysis of the circuit. A Test Index (T.I.) that permits the selection of the set of frequencies that better leads to locating parametric faults in analog circuits is defined. By exploiting symbolic analysis techniques, a program that implements the proposed procedure has been developed. It yields the requested set of frequencies by means of an optimization procedure based on a genetic algorithm that minimizes the T.I. Examples of the application of the proposed procedure are also included.
引用
收藏
页码：2322 / 2329
页数：8
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