THE DEVELOPMENT OF SECONDARY ION MASS-SPECTROMETRY (SIMS) - A RETROSPECTIVE - COMMENT

被引：0

作者：

GRIES, WH

机构：

来源：

INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES | 1986年 / 70卷 / 01期

关键词：

D O I：

10.1016/0168-1176(86)85066-2

中图分类号：

O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];

学科分类号：

070203 ; 070304 ; 081704 ; 1406 ;

摘要：

引用

页码：115 / 115

页数：1

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