THE DEVELOPMENT OF SECONDARY ION MASS-SPECTROMETRY (SIMS) - A RETROSPECTIVE - COMMENT

被引：0

|

作者：

GRIES, WH

机构：

来源：

INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES | 1986年 / 70卷 / 01期

关键词：

D O I：

10.1016/0168-1176(86)85066-2

中图分类号：

O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];

学科分类号：

070203 ; 070304 ; 081704 ; 1406 ;

摘要：

引用

收藏

页码：115 / 115

页数：1

相关论文

共 50 条

[31] HIGH-RESOLUTION SECONDARY ION MASS-SPECTROMETRY (SIMS) FOR USE IN CHEMISTRY
KLOPPEL, KD
VONBUNAU, G
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1981, 39 (01): : 85 - 93
[32] SECONDARY ION MASS-SPECTROMETRY (SIMS) OF STANDARDS FOR ANALYSIS OF SOFT BIOLOGICAL TISSUE
BURNSBELLHORN, MS
FILE, DM
ANALYTICAL BIOCHEMISTRY, 1979, 92 (01) : 213 - 221
[33] ANALYSIS OF CONDUCTING AND INSULATING SURFACES BY MEANS OF SECONDARY ION MASS-SPECTROMETRY (SIMS)
DEPAZ, M
MACCIO, C
ZEITSCHRIFT FUR NATURFORSCHUNG SECTION A-A JOURNAL OF PHYSICAL SCIENCES, 1975, 30 (6-7): : 831 - 834
[34] SECONDARY ION MASS-SPECTROMETRY
HEDBAVNY, P
CESKOSLOVENSKY CASOPIS PRO FYSIKU SEKCE A, 1974, 24 (04): : C396 - 397
[35] SECONDARY ION MASS-SPECTROMETRY
CAVALLINI, M
JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1982, 7 (03): : A50 - A50
[36] SECONDARY ION MASS-SPECTROMETRY
MORRISON, GH
ANALYTICAL CHEMISTRY, 1986, 58 (01) : 1 - 1
[37] SECONDARY ION MASS-SPECTROMETRY
KENWAYJACKSON, C
VACUUM, 1984, 34 (3-4) : 479 - 480
[38] SECONDARY ION MASS-SPECTROMETRY
WILLIAMS, P
ANNUAL REVIEW OF MATERIALS SCIENCE, 1985, 15 : 517 - 548
[39] ION-SCATTERING SPECTROSCOPY AND SECONDARY ION MASS-SPECTROMETRY (ISS/SIMS) STUDIES OF ZEOLITES
SUIB, SL
COUGHLIN, DF
OTTER, FA
CONOPASK, LF
JOURNAL OF CATALYSIS, 1983, 84 (02) : 410 - 422
[40] Quantitative secondary ion mass spectrometry (SIMS)
Schiffmann, Kirsten Ingolf
VAKUUM IN FORSCHUNG UND PRAXIS, 2014, 26 (02) : 27 - 35

← 1 2 3 4 5 →