SECONDARY ION MASS-SPECTROMETRY

被引：0

作者：

CAVALLINI, M ^{[1
]}

机构：

[1] ASSORENI,I-00015 MONTEROTONDO,ITALY

来源：

JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES | 1982年 / 7卷 / 03期

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：A50 / A50

页数：1

共 50 条

[1] INSTRUMENTAL ASPECTS OF SECONDARY ION MASS-SPECTROMETRY AND SECONDARY ION IMAGING MASS-SPECTROMETRY
WERNER, HW
[J]. VACUUM, 1972, 22 (11) : 613 - 617
[2] SECONDARY ION MASS-SPECTROMETRY
VICKERMAN, JC
[J]. CHEMISTRY IN BRITAIN, 1987, 23 (10) : 969 - &
[3] SECONDARY ION MASS-SPECTROMETRY
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[J]. CESKOSLOVENSKY CASOPIS PRO FYSIKU SEKCE A, 1974, 24 (04): : C396 - 397
[4] SECONDARY ION MASS-SPECTROMETRY
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[J]. ANALYTICAL CHEMISTRY, 1986, 58 (01) : 1 - 1
[5] SECONDARY ION MASS-SPECTROMETRY
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[J]. ANNUAL REVIEW OF MATERIALS SCIENCE, 1985, 15 : 517 - 548
[6] SECONDARY ION MASS-SPECTROMETRY
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[J]. VACUUM, 1984, 34 (3-4) : 479 - 480
[7] ION NEUTRALIZATION IN SECONDARY ION MASS-SPECTROMETRY
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MACDONALD, RJ
OCONNOR, DJ
[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 218 (1-3): : 333 - 335
[8] SECONDARY ION MASS-SPECTROMETRY (SIMS)
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[J]. DENKI KAGAKU, 1990, 58 (03): : 211 - 217
[9] SECONDARY ION MASS-SPECTROMETRY (SIMS)
SHINODA, G
[J]. JOURNAL OF ELECTRON MICROSCOPY, 1975, 24 (01): : 57 - 58
[10] QUANTITATIVE SECONDARY ION MASS-SPECTROMETRY
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[J]. JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS, 1988, 93 (03): : 510 - 518