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NONDESTRUCTIVE SCREENING FOR LOW-VOLTAGE FAILURE IN MULTILAYER CERAMIC CAPACITORS

被引：3
|
作者：
CHITTICK, RC
GRAY, E
ALEXANDER, JH
DRAKE, MP
BUSH, EL
机构：
来源：
IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY | 1983年 / 6卷 / 04期
关键词：
D O I：
10.1109/TCHMT.1983.1136221
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：510 / 516
页数：7
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