CALIBRATION AND USE OF A LITHIUM-DRIFTED SILICON DETECTOR FOR ACCURATE ANALYSIS OF X-RAY-SPECTRA

被引：17
|
作者：
KEITH, HD [1 ]
LOOMIS, TC [1 ]
机构：
[1] BELL TEL LABS INC,MURRAY HILL,NJ 07974
来源：
X-RAY SPECTROMETRY | 1976年 / 5卷 / 02期
关键词：
D O I：
10.1002/xrs.1300050210
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
引用
收藏
页码：93 / 103
页数：11
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