CALIBRATION AND USE OF A LITHIUM-DRIFTED SILICON DETECTOR FOR ACCURATE ANALYSIS OF X-RAY-SPECTRA

被引：17

作者：

KEITH, HD ^{[1
]}

LOOMIS, TC ^{[1
]}

机构：

[1] BELL TEL LABS INC,MURRAY HILL,NJ 07974

来源：

X-RAY SPECTROMETRY | 1976年 / 5卷 / 02期

关键词：

D O I：

10.1002/xrs.1300050210

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：93 / 103

页数：11

共 50 条

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