共 50 条
- [42] ELLIPSOMETRY - A METHOD FOR THE CHARACTERIZATION OF THIN-FILMS BERICHTE DER BUNSEN-GESELLSCHAFT-PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 1981, 85 (10): : 847 - 851
- [43] LOW-TEMPERATURE ORGANOMETALLIC CHEMICAL VAPOR-DEPOSITION (OMCVD) OF RHODIUM AND IRIDIUM THIN-FILMS ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1990, 199 : 148 - INOR
- [47] LASER DEPOSITED THIN-FILMS OF SIO, ZNS, MGF2 REVUE ROUMAINE DE PHYSIQUE, 1973, 18 (02): : 263 - 265