SIMS DEPTH PROFILING OF POLYMER SURFACES

被引：10
|
作者：
CHUJO, R
机构：
[1] Department of Biomolecular Engineering, Tokyo Institute of Technology
来源：
POLYMER JOURNAL | 1991年 / 23卷 / 05期
关键词：
DEPTH PROFILING; CONCENTRATION GRADIENT; SIMS; DIFFUSION EQUATION; SURFACE TENSION; FLUORINATED POLYOLEFIN; POLYMER BLEND; OPTICAL FIBER; VIDEO TAPE;
D O I：
10.1295/polymj.23.367
中图分类号：
O63 [高分子化学（高聚物）];
学科分类号：
070305 ; 080501 ; 081704 ;
摘要：
Concentration gradient was found in surface-fluorinated polyolefin films from SIMS depth profilings. Results were analyzed with a one-dimensional diffusion equation modified by the effect of chemical reaction. Similar gradients were found in the blends of poly (vinylidene fluoride) and poly (methyl methacrylate), the polymer optical fibers, and video tapes.
引用
收藏
页码：367 / 377
页数：11
相关论文
共 50 条
  • [21] Optimizing C60 incidence angle for polymer depth profiling by ToF-SIMS
    Iida, Shin-ichi
    Miyayama, Takuya
    Sanada, Noriaki
    Suzuki, Mineharu
    Fisher, Gregory L.
    Bryan, Scott R.
    SURFACE AND INTERFACE ANALYSIS, 2011, 43 (1-2) : 214 - 216
  • [22] SIMS FOR THE STUDY OF POLYMER SURFACES - A REVIEW
    BRIGGS, D
    SURFACE AND INTERFACE ANALYSIS, 1986, 9 (1-6) : 391 - 404
  • [23] DEPTH PROFILING BY SIMS DEPTH RESOLUTION, DYNAMIC-RANGE AND SENSITIVITY
    MAGEE, CW
    HONIG, RE
    SURFACE AND INTERFACE ANALYSIS, 1982, 4 (02) : 35 - 41
  • [24] A SIMS DEPTH PROFILING STUDY OF THE HYDRATION LAYER FORMED AT POLYCRYSTALLINE TIN OXIDE SURFACES BY ATMOSPHERIC EXPOSURE
    COX, DF
    HOFLUND, GB
    HOCKING, WH
    APPLIED SURFACE SCIENCE, 1986, 26 (02) : 239 - 245
  • [25] ToF-SIMS depth profiling of altered glass
    Marie Collin
    Stéphane Gin
    Patrick Jollivet
    Laurent Dupuy
    Vincent Dauvois
    Laurent Duffours
    npj Materials Degradation, 3
  • [26] Bevel depth profiling SIMS for analysis of layer structures
    Gillen, G
    Wight, S
    Chi, P
    Fahey, A
    Verkouteren, J
    Windsor, E
    Fenner, DB
    CHARACTERIZATION AND METROLOGY FOR ULSI TECHNOLOGY, 2003, 683 : 710 - 714
  • [27] SIMS depth profiling of advanced gate dielectric materials
    Bennett, J
    Gondran, C
    Sparks, C
    Hung, PY
    Hou, A
    APPLIED SURFACE SCIENCE, 2003, 203 : 409 - 413
  • [28] ToF-SIMS depth profiling of altered glass
    Collin, Marie
    Gin, Stephane
    Jollivet, Patrick
    Dupuy, Laurent
    Dauvois, Vincent
    Duffours, Laurent
    NPJ MATERIALS DEGRADATION, 2019, 3 (01)
  • [29] HYDROGEN DEPTH PROFILING USING SIMS - PROBLEMS AND THEIR SOLUTIONS
    MAGEE, CW
    BOTNICK, EM
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 19 (01): : 47 - 52
  • [30] SIMS backside depth profiling of ultra shallow implants
    Yeo, KL
    Wee, ATS
    See, A
    Liu, R
    Ng, CM
    APPLIED SURFACE SCIENCE, 2003, 203 : 335 - 338
12345