SIMS DEPTH PROFILING OF POLYMER SURFACES

被引：10
|
作者：
CHUJO, R
机构：
[1] Department of Biomolecular Engineering, Tokyo Institute of Technology
来源：
POLYMER JOURNAL | 1991年 / 23卷 / 05期
关键词：
DEPTH PROFILING; CONCENTRATION GRADIENT; SIMS; DIFFUSION EQUATION; SURFACE TENSION; FLUORINATED POLYOLEFIN; POLYMER BLEND; OPTICAL FIBER; VIDEO TAPE;
D O I：
10.1295/polymj.23.367
中图分类号：
O63 [高分子化学（高聚物）];
学科分类号：
070305 ; 080501 ; 081704 ;
摘要：
Concentration gradient was found in surface-fluorinated polyolefin films from SIMS depth profilings. Results were analyzed with a one-dimensional diffusion equation modified by the effect of chemical reaction. Similar gradients were found in the blends of poly (vinylidene fluoride) and poly (methyl methacrylate), the polymer optical fibers, and video tapes.
引用
收藏
页码：367 / 377
页数：11
相关论文
共 50 条
  • [31] SIMS depth profiling of N and In in a ZnO single crystal
    Park, DC
    Sakaguchi, I
    Ohashi, N
    Hishita, S
    Haneda, H
    APPLIED SURFACE SCIENCE, 2003, 203 : 359 - 362
  • [32] TRANSIENT EFFECTS DURING SIMS DEPTH PROFILING WITH OXYGEN
    AVAU, D
    VANDERVORST, W
    MAES, HE
    SURFACE AND INTERFACE ANALYSIS, 1988, 11 (10) : 522 - 528
  • [33] SIMS DEPTH PROFILING USING NEW GATE TECHNIQUES
    MAUL, JL
    FRENZEL, H
    FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1989, 333 (4-5): : 318 - 318
  • [34] QUANTITATIVE HYDROGEN DEPTH-PROFILING USING SIMS
    LUNDQUIST, TR
    BURGNER, RP
    SWANN, PR
    TSONG, IST
    APPLIED SURFACE SCIENCE, 1981, 7 (1-2) : 2 - 6
  • [35] A new approach to express ToF SIMS depth profiling
    Yunin, Pavel Andreevich
    Drozdov, Yurii Nikolaevich
    Drozdov, Mikhail Nikolaevich
    SURFACE AND INTERFACE ANALYSIS, 2015, 47 (07) : 771 - 776
  • [36] SIMS - USEFUL COMPLEMENT TO OTHER DEPTH PROFILING TECHNIQUES
    BAUN, WL
    MCDEVITT, NT
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (01): : 504 - 504
  • [37] ON THE SIMS DEPTH PROFILING ANALYSIS - REDUCTION OF MATRIX EFFECT
    GAO, Y
    MARIE, Y
    SALDI, F
    MIGEON, HN
    INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1995, 143 : 11 - 18
  • [38] CHARACTERIZATION OF MATERIALS USING SIMS IMAGE DEPTH PROFILING
    NOVAK, SW
    KANBER, H
    LOWDEN, R
    ADVANCED CHARACTERIZATION TECHNIQUES CERAMICS, 1988, 5 : 102 - 111
  • [39] C60 molecular depth profiling of bilayered polymer films using ToF-SIMS
    PCPM, Université Catholique de Louvain , Croix du sud 1, B-1348 Louvain-la-Neuve, Belgium
    Surf Interface Anal, 1-2 (175-178):
  • [40] C60 molecular depth profiling of bilayered polymer films using ToF-SIMS
    Mouhib, T.
    Delcorte, A.
    Poleunis, C.
    Bertrand, P.
    SURFACE AND INTERFACE ANALYSIS, 2011, 43 (1-2) : 175 - 178
12345