A FIELD-ION MICROSCOPE IMAGING ATOM PROBE FOR INSITU SURFACE STUDIES

被引：0
|
作者：
DONE, S
WALLS, JM
机构：
来源：
INSTITUTE OF PHYSICS CONFERENCE SERIES | 1983年 / 68期
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中图分类号：
O4 [物理学];
学科分类号：
0702 ;
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页码：495 / 498
页数：4
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