ATOM PROBE FIELD-ION MICROSCOPY OF A FENIB GLASS

被引：127

作者：

PILLER, J

HAASEN, P

机构：

来源：

ACTA METALLURGICA | 1982年 / 30卷 / 01期

关键词：

D O I：

10.1016/0001-6160(82)90038-4

中图分类号：

TF [冶金工业];

学科分类号：

0806 ;

摘要：

引用

页码：1 / 8

页数：8

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