ATOM-PROBE FIELD-ION MICROSCOPES AND HIGH-FIELD SURFACE EFFECTS

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作者：

MULLER, EW ^{[1
]}

机构：

[1] PENN STATE UNIV,DEPT PHYS,UNIVERSITY PK,PA 16802

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS | 1974年

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O59 [应用物理学];

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页码：1 / 10

页数：10

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