THE CRITICAL VOLTAGE EFFECT IN THE SCANNING BACKSCATTERING ELECTRON-MICROSCOPY

被引：0
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作者：
DUDAREV, SL
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来源：
KRISTALLOGRAFIYA | 1988年 / 33卷 / 02期
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中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
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页码：324 / 330
页数：7
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