SCANNING ELECTRON-MICROSCOPY OF SOYBEANS

被引：0

作者：

WOLF, WJ

BAKER, FL

机构：

来源：

CEREAL SCIENCE TODAY | 1972年 / 17卷 / 05期

关键词：

D O I：

暂无

中图分类号：

TS2 [食品工业];

学科分类号：

0832 ;

摘要：

引用

页码：124 / +

页数：1

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