STATUS AND PROBLEMS OF SEMICONDUCTOR-DETECTORS

被引：12

作者：

WALTON, JT

GOULDING, FS

HALLER, EE

PEHL, RH

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1982年 / 196卷 / 01期

关键词：

D O I：

10.1016/0029-554X(82)90624-3

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：107 / 116

页数：10

共 50 条

[41] CARRIER TRANSPORT IN SEMICONDUCTOR-DETECTORS OF MAGNETIC DOMAINS
NATHAN, A
ALLEGRETTO, W
BALTES, HP
SUGIYAMA, Y
[J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1987, 34 (10) : 2077 - 2085
[42] SEMICONDUCTOR-DETECTORS OF ACTIVE PARTICLES IN PHYSICOCHEMICAL STUDIES
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[J]. ZHURNAL VSESOYUZNOGO KHIMICHESKOGO OBSHCHESTVA IMENI D I MENDELEEVA, 1975, 20 (01): : 19 - 32
[43] DYNAMIC CHARACTERISTICS OF SEMICONDUCTOR-DETECTORS OF ACTIVE PARTICLES
LIVSHITS, AI
GUTMAN, EE
MYASNIKOV, IA
[J]. ZHURNAL FIZICHESKOI KHIMII, 1979, 53 (03): : 775 - 777
[44] RECENT DEVELOPMENTS IN SEMICONDUCTOR-DETECTORS AND ON-CHIP ELECTRONICS
STRUDER, L
[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1989, 283 (03): : 387 - 398
[45] APPLICATION OF SEMICONDUCTOR-DETECTORS IN TOTAL-BODY IRRADIATION
不详
[J]. MEDICAL PHYSICS, 1987, 14 (04) : 705 - 705
[46] PLASMA TIMES FOR FISSION FRAGMENTS STOPPED IN SEMICONDUCTOR-DETECTORS
FINCH, EC
[J]. NUCLEAR INSTRUMENTS & METHODS, 1975, 129 (02): : 617 - 617
[47] METHOD FOR MEASUREMENTS OF SENSITIVE LAYER THICKNESS OF SEMICONDUCTOR-DETECTORS
ILYASOV, AZ
MAZITOV, BS
[J]. PRIBORY I TEKHNIKA EKSPERIMENTA, 1974, (02): : 60 - 62
[48] SEMICONDUCTOR-DETECTORS FOR ALPHA-ACTIVITY MEASUREMENT OF LIQUIDS
BYCHENKOV, AI
MALAFEEV, MP
SIROTININ, AN
[J]. PRIBORY I TEKHNIKA EKSPERIMENTA, 1975, (04): : 39 - 41
[49] INFLUENCE OF TRAPS ON RESPONSE OF SEMICONDUCTOR-DETECTORS OF NUCLEAR RADIATION
EVDOKIMOV, VM
ZAKHARCHUK, OV
ROMANYUK, OA
BORISOVA, NA
FEDOSEEVA, OP
[J]. SOVIET PHYSICS SEMICONDUCTORS-USSR, 1979, 13 (03): : 335 - 337
[50] MULTICHANNEL SEMICONDUCTOR-DETECTORS FOR X-RAY CT
JIMBO, M
NARUSE, Y
SUGITA, T
KOBAYASHI, T
[J]. JOURNAL OF COMPUTER ASSISTED TOMOGRAPHY, 1980, 4 (05) : 717 - 717

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