STATUS AND PROBLEMS OF SEMICONDUCTOR-DETECTORS

被引：12
|
作者：
WALTON, JT
GOULDING, FS
HALLER, EE
PEHL, RH
机构：
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1982年 / 196卷 / 01期
关键词：
D O I：
10.1016/0029-554X(82)90624-3
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：107 / 116
页数：10
相关论文
共 50 条
  • [31] DIGITAL BIAS VOLTAGE CONTROLLER FOR SEMICONDUCTOR-DETECTORS
    GLADYSHEV, DA
    KASATOV, VL
    LI, BN
    [J]. INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1981, 24 (03) : 715 - 717
  • [32] SEMICONDUCTOR-DETECTORS FOR THE MEASUREMENT OF INFRARED RADIATION PULSES
    MESHCHERYAKOV, AB
    [J]. INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1979, 22 (01) : 235 - 236
  • [33] CONSTANT SLOPE TIMING FOR NUCLEAR SEMICONDUCTOR-DETECTORS
    MOLEA, M
    [J]. NUCLEAR INSTRUMENTS & METHODS, 1979, 163 (01): : 157 - 159
  • [34] LOW-NOISE ELECTRONICS FOR SEMICONDUCTOR-DETECTORS
    GOSTILO, VV
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1992, 322 (03): : 566 - 568
  • [35] DELAYED COINCIDENCE MEASUREMENTS USING SEMICONDUCTOR-DETECTORS
    BISHOP, RJ
    [J]. NUCLEAR INSTRUMENTS & METHODS, 1974, 115 (01): : 61 - 64
  • [36] ENERGY RESOLUTION OF SEMICONDUCTOR-DETECTORS WITH ALTERNATING BIAS
    PETROV, AS
    MEDVEDEV, YV
    BORZUNOV, NG
    [J]. SOVIET PHYSICS SEMICONDUCTORS-USSR, 1976, 10 (07): : 769 - 772
  • [37] CHARGE LOSSES IN DENSE TRACKS IN SEMICONDUCTOR-DETECTORS
    EREMIN, VK
    STROKAN, NB
    TISNEK, NI
    [J]. SOVIET PHYSICS SEMICONDUCTORS-USSR, 1976, 10 (01): : 33 - 36
  • [38] SEMICONDUCTOR-DETECTORS FOR THE CALIBRATION OF FISSILE RADIONUCLIDE TARGETS
    LASHAEV, SI
    SOLOVIEV, SM
    SOLOSHENKOV, PS
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1989, 282 (01): : 315 - 316
  • [39] SEMICONDUCTOR-DETECTORS SETUP FOR NUCLEAR SPECTROSCOPY STUDIES
    BOSCH, HE
    DAVIDSON, J
    FARIOLLI, MA
    SILBERGLEIT, V
    [J]. NUCLEAR INSTRUMENTS & METHODS, 1974, 117 (01): : 213 - 219
  • [40] SEMICONDUCTOR-DETECTORS OF HARD BREMSSTRAHLUNG IN FLAW DETECTION
    GORBUNOV, VI
    MELIKHOV, VS
    [J]. SOVIET JOURNAL OF NONDESTRUCTIVE TESTING-USSR, 1978, 14 (02): : 119 - 126
12345