DELAYED COINCIDENCE MEASUREMENTS USING SEMICONDUCTOR-DETECTORS

被引：1
|
作者：
BISHOP, RJ [1 ]
机构：
[1] KINGSTON POLYTECH,SCH PHYS,KINGSTON UPON THAMES,SURREY,ENGLAND
来源：
NUCLEAR INSTRUMENTS & METHODS | 1974年 / 115卷 / 01期
关键词：
D O I：
10.1016/0029-554X(74)90425-X
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：61 / 64
页数：4
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