ATOMIC NUMBER INTENSITY PROFILES IN SCANNING ELECTRON-MICROSCOPE - GOLD AND ALUMINUM

被引：4

作者：

ROBINSON, VNE

GEORGE, EP

机构：

[1] UNIV NEW S WALES,FAC APPL SCI,KENSINGTON 2033,NEW S WALES,AUSTRALIA

[2] UNIV NEW S WALES,SCH PHYS,KENSINGTON 2033,NEW S WALES,AUSTRALIA

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1976年 / 107卷 / MAY期

关键词：

D O I：

10.1111/j.1365-2818.1976.tb02426.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：85 / 91

页数：7

共 50 条

[41] DIODE STRUCTURES IN A SCANNING ELECTRON-MICROSCOPE
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[42] PLANT ULTRASTRUCTURE IN THE SCANNING ELECTRON-MICROSCOPE
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[43] TYPICAL SCANNING ELECTRON-MICROSCOPE FRACTOGRAPHS
不详
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[44] BIOLOGICAL APPLICATIONS OF SCANNING ELECTRON-MICROSCOPE
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[45] DETECTION SYSTEM FOR SCANNING ELECTRON-MICROSCOPE
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[46] TRANSMISSION STAGE FOR SCANNING ELECTRON-MICROSCOPE
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[48] VISUALIZATION OF FINGERPRINTS IN SCANNING ELECTRON-MICROSCOPE
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[49] TEST OBJECT FOR A SCANNING ELECTRON-MICROSCOPE
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[50] GIGAHERTZ STROBOSCOPY WITH SCANNING ELECTRON-MICROSCOPE
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