ATOMIC NUMBER INTENSITY PROFILES IN SCANNING ELECTRON-MICROSCOPE - GOLD AND ALUMINUM

被引：4

作者：

ROBINSON, VNE

GEORGE, EP

机构：

[1] UNIV NEW S WALES,FAC APPL SCI,KENSINGTON 2033,NEW S WALES,AUSTRALIA

[2] UNIV NEW S WALES,SCH PHYS,KENSINGTON 2033,NEW S WALES,AUSTRALIA

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1976年 / 107卷 / MAY期

关键词：

D O I：

10.1111/j.1365-2818.1976.tb02426.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：85 / 91

页数：7

共 50 条

[21] DETECTORS FOR THE SCANNING ELECTRON-MICROSCOPE
OATLEY, CW
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1981, 14 (08): : 971 - 976
[22] MICROMANIPULATOR FOR SCANNING ELECTRON-MICROSCOPE
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[23] THE DEVELOPMENT OF THE SCANNING ELECTRON-MICROSCOPE
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[24] SCANNING ELECTRON-MICROSCOPE AUTOFLUOROGRAPHY
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[25] STEREOTECHNIQUES WITH SCANNING ELECTRON-MICROSCOPE
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[26] PHOTOGRAMMETRY WITH SCANNING ELECTRON-MICROSCOPE
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[27] SHIELDED SCANNING ELECTRON-MICROSCOPE
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[28] STEREOVISION IN A SCANNING ELECTRON-MICROSCOPE
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[29] ATOMIC RESOLUTION WITH THE ELECTRON-MICROSCOPE
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[30] ATOMIC-FORCE MICROSCOPE USING PIEZORESISTIVE CANTILEVERS AND COMBINED WITH A SCANNING ELECTRON-MICROSCOPE
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